Question Paper Code : 50968
B.E./B.Tech. DEGREE EXAMINATIONS, APRIL/MAY 2024.
Fifth Semester
Electronics and Communication Engineering
EC 3552 — VLSI AND CHIP DESIGN
(Common to : Electronics and Telecommunication Engineering)
(Regulations 2021)
Answer ALL questions.
PART A — (10 × 2 = 20 marks)
- 1.
What is threshold voltage of MOS transistor?
- 2.
Show how nMOSFET acts as a switch?
- 3.
What is stick diagram? Draw the stick diagram for two input NAND gate.
- 4.
Realize the two input NAND gate using pass transistor logic.
- 5.
Differentiate latches and registers.
- 6.
What is clock skew? How to overcome clock skew?
- 7.
Find the propagation delay of n-bit carry select adder.
- 8.
Write the logic equation for the 3-bit magnitude comparator.
- 9.
List the issues in testing microchip design process.
- 10.
What are the different types of ASICs?
PART B — (5 × 13 = 65 marks)
- 11.(a)
- (i)Obtain the drain current in three different regions of operation.(7)
- (ii)Show how channel length modulation affects the drain current and body effect affects the threshold voltage?(6)
- Or
- (b)
What is the dynamic condition of MOSFET? Discuss the transistor characteristics of MOSFET under dynamic conditions.
- 12.(a)
- (i)Find the Elmore's constant of the 4-input NAND gate.(7)
- (ii)Realize the 4:2 encoder using CMOS logic.(6)
- Or
- (b)
- (i)Explain the concept of dynamic logic. Realize the 3-input NAND gate using dynamic logic.(7)
- (ii)Describe the disadvantages of dynamic logic. Provide the solution to overcome the dynamic logic.(6)
- 13.(a)
Elucidate the static latches and registers suitable for sequential logic circuit design.
- Or
- (b)
- (i)Draw the monostable multivibrator using CMOS transistor and explain the operation.(7)
- (ii)What are the timing classification of digital systems? Show how the timing is applied for synchronous design.(6)
- 14.(a)
- (i)What is the need for carry save adder? Explain the 4-bit carry save adder.(6)
- (ii)What is an array multiplier? Show how array multiplier uses an array of cells for computing the result.(7)
- Or
- (b)
Illustrate the hierarchical memory architecture and explain the building blocks of memory architecture.
- 15.(a)
- (i)What are the faults in ASIC design? Model the faults in ASIC design.(7)
- (ii)Explain the design flow process suitable for ASIC.(6)
- Or
- (b)
- (i)Write the test bench in Verilog HDL for a combinational circuit.(6)
- (ii)Explain the test interface and boundary scan suitable for scan design.(7)
PART C — (1 × 15 = 15 marks)
- 16.(a)
- (i)What is pipelining? Apply the pipelining concept and find the total clock time required for obtaining outputs for y = |a_n + b_n| where n = 1, 2, 3, 4, 5.(7)
- (ii)Realize the function F = Sum m(1, 5, 6, 7) using (1) Pseudo nMOS logic (2) Static CMOS logic.(8)
- Or
- (b)
- (i)Generate the test vectors for the combinational function F = (AB + BC + CD) using automatic test pattern generation for the stuck-at-0 fault at node B.(8)
- (ii)Realize the functions F1 = X0 X1 + X1' X2'; F2 = X0' X1' + X1 X2 sing programmable logic array.(7)