Question Paper Code : 40989
B.E./B.Tech. DEGREE EXAMINATIONS, NOVEMBER/DECEMBER 2024.
Fifth Semester
Electronics and Communication Engineering
EC 3552 — VLSI AND CHIP DESIGN
(Common to : Electronics and Telecommunication Engineering)
(Regulations 2021)
Answer ALL questions.
PART A — (10 × 2 = 20 marks)
- 1.
How NMOS and PMOS act as a switch?
- 2.
What is the body effect of MOS transistor?
- 3.
Draw the stick diagram for two input NOR gate.
- 4.
What is the significance of propagation delay?
- 5.
Differentiate latches and flipflops.
- 6.
What are the basic timing classifications of digital systems?
- 7.
List the interconnect parameters in chip design.
- 8.
Write the logic equation for 4-bit comparators.
- 9.
Sketch the ASIC design flow?
- 10.
Differentiate embedded cores and SOCs.
PART B — (5 × 13 = 65 marks)
- 11.(a)
List and explain the regions of operation of MOS transistor and obtain the drain current for all regions.
- Or
- (b)
Discuss the MOS transistor under dynamic conditions.
- 12.(a)
Realize the 2:1 multiplexer using
- (i)Static CMOS logic(5)
- (ii)Dynamic CMOS logic(4)
- (iii)Pass transistor logic(4)
- Or
- (b)
- (i)Illustrate the low power design principles of CMOS circuits.(7)
- (ii)Explain the design considerations in static CMOS logic.(6)
- 13.(a)
- (i)Elucidate the dynamic latches and registers suitable for sequential circuit design.(7)
- (ii)Elaborate the sense amplifier based register for sequential circuit design.(6)
- Or
- (b)
Compare the mono-stable and bistable multivibrator circuit based on MOS transistors.
- 14.(a)
Design a high speed 4-bit adder and compare with the existing adders with respect to speed of operation.
- Or
- (b)
- (i)Implement the full adder using PLA.(6)
- (ii)Explain the memory architecture and the basic building blocks.(7)
- 15.(a)
- (i)Illustrate the microchip design process and identify the issues in test. Validate the verification of the complex chips?(7)
- (ii)Model the faults associated in CMOS design.(6)
- Or
- (b)
- (i)What is the need for testing? Explain the operation of automatic test pattern generation.(7)
- (ii)Write the test bench for VHDL code to test the 2-to-4 decoder logic.(6)
PART C — (1 × 15 = 15 marks)
- 16.(a)
- (i)Obtain the elmore delay constant for the four input NAND gate.(8)
- (ii)Write the disadvantage(s) of dynamic CMOS logic. Provide three possible solutions to overcome the disadvantages.(7)
- Or
- (b)
- (i)Design a master-slave register using transmission gates and draw the logic waveform. Find the setup time and hold time for the register.(8)
- (ii)Implement a 2-to-4 decoder using ROM.(7)